PF-60 “Point autofocus probe surface texture measuring instrument”
Scan autofocus (Scan AF) system offers fast measurement and has large measuring area with high accuracy in the sub-micrometer level
Product List
Point Autofocus Probe Surface Texture Measuring Instrument
Scan autofocus (Scan AF) system offers fast measurement and has large measuring area with high accuracy in the sub-micrometer level
Video Library
PF-60 in action!
Information
We welcome your inquiry by telephone / fax / information request form.
Measuring Examples
High precision measurement of a transparent lens with steep angles.
High speed and high precision measurements of sub-micrometer grooves.
Volume and height evaluation of solder out of 3D surface.
Tracking rugged lens surface.
Measurement of delicate sample which easily distorts by one gentle touch.
Fine structure in a large area.
Diamond turning processed surface.
High precision measurement of delicate material.
Capturing fine structure.
High precision measurement of nano-meter level unevenness.
Cutting edge profile and projection height measurements.
Offering 3D view, size evaluation and roughness measurement.
Enhanced functions for profile and height measurements, coplanarity evaluation, etc.
High speed measurement of total warpage and waviness of wafer.
Calculating areal roughness out of measuring area.
Separating burr / contact surface / wearing surface and calculating Abbott-Firestone curve.
Form measurement and surface roughness evaluation of a precision gear.
