- Non-contact measurement (perfect solution for measuring delicate micro-parts that are easily deformed by contact stylus instruments)
- Immune to surface colors and reflectance properties of samples (glass, ceramic, metal, plastic, liquid, etc.)
- Measuring steep angles
- Large measuring area in high resolution
(measuring range: less than φ80mm, resolution: axial direction 0.01µm circumferential direction: 0.1µm) - Monitoring the actual measuring point (microscope observation function)
- High correlation with the international standards for roughness measurement (compliant with JISB0601: 2001)
- Contour measuring for arbitrary cross section (nondestructive profile measurement)
- No need of centering sample adjustment (auto-detection of rotation)
MLP-2 "Laser probe contour measuring instrument"
A compact laser probe head and 5-axis control enable all-round contour measurements
Mitaka has achieved to make the original laser probe unit smaller than that of NH Series. Combination of the high-precision 5-axis and XY stage provide sub-µm level of profile measurements of various samples. As well as NH Series, MLP-2 is completely non-contact measuring instrument which also provides non-destructive measurements.
Features
Functions
- Contour measurement (polygons, profiles, roughness)
- Image capture
- Contour / size evaluation
- Surface roughness evaluation
- Gear profile measurement / evaluation (optional)
- Evaluation of cutting edge of tools (optional)
- Roundness evaluation (optional)
- Home
- Products
- Industrial Equipment
- MLP-2
