Japanese

Warpage and waviness of wafer

High speed measurement of total warpage and waviness of wafer.

Best instrument Table of specification

Point Autofocus Probe 3D Measuring Instrument

NH-3Ns

Standard model of NH-Series

Point Autofocus Probe 3D Measuring Instrument

NH-4Ns

The perfect solution for densified and large-scaled semiconductor quality control

Point Autofocus Probe Surface Texture Measuring Instrument

PF-60

Scan autofocus (Scan AF) system offers fast measurement and has large measuring area with high accuracy in the sub-micrometer level

Measurable Instruments