Japanese

Surface roughness evaluation function

he only non-contact measuring instrument which has a high correlation with contact roughness measuring instruments.

NIST SRM 2074 Roughness standard (Ra=0.972±0.025µm)

MLP-2 carries out roughness evaluation by defining a cut-off value from a measured profile data. (ISO 4287: 1997)

Also, MLP-2 has been attracting worldwide attention since it has a high correlation with contact roughness measuring instruments. Reports indicated below show a measurement result of NIST SRM 2074 roughness standard and its measured profile (partially enlarged). MLP-2 measured Ra=0.971μm whereas NIST's guaranteed value is Ra=0.972(±0.025)μm. This result proves that MLP-2 has a high correlation with contact roughness measuring instrument which NIST measures her roughness standards.

NIST SRM 2074 Roughness standard evaluation result

NIST SRM 2074 Roughness standard measurement result (partially enlarged)