Mitaka has been manufacturing precision instruments that are loaded with space hardware technology. And, these instruments function as “standard” in various industries. Above all, non-contact 3D measuring instruments with laser autofocus systems are disseminated widely in domestic semiconductor industry and ultraprecision processing field in Japan. And this laser autofocus system was named as “point autofocus profiling” and registered in ISO 25178 (International Standard of 3D profile and surface texture) as one of Japanese measuring technology in 2008. The point autofocus profiling is officially standardized as ISO 25178-605 (Point autofocus probe) in 2014. Mitaka continues to offer this “brand-new” technology to the world.
Measuring instruments
Faster, easier, more precise
PF Series
Scan AF function offers large measuring area in high speed
Point autofocus probe 3D measuring instrument
NH Series
Standard model of NH-Series
3D FORM MEASURING INSTRUMENT
MLP Series
Non-contact measuring instrument
3D measuring instrument
MA Series
Microlens array form measuring and optical characteristic evaluation instrument
Laser probe unit
MP Series
Applications for laser probe unit