Mitaka has been manufacturing precision instruments that are loaded with space hardware technology. And, these instruments function as “standard” in various industries. Above all, non-contact 3D measuring instruments with laser autofocus systems are disseminated widely in domestic semiconductor industry and ultraprecision processing field in Japan. And this laser autofocus system was named as “point autofocus profiling” and registered in ISO 25178 (International Standard of 3D profile and surface texture) as one of Japanese measuring technology in 2008. The point autofocus profiling is officially standardized as ISO 25178-605 (Point autofocus probe) in 2014. Mitaka continues to offer this “brand-new” technology to the world.
Measuring instruments

Faster, easier, more precise
                    
                    
                      PF Series
Scan AF function offers large measuring area in high speed

Point autofocus probe 3D measuring instrument
                    
                    
                      NH Series
Standard model of NH-Series

3D FORM MEASURING INSTRUMENT
                    
                    
                      MLP Series
Non-contact measuring instrument

3D measuring instrument
                    
                    
                      MA Series
Microlens array form measuring and optical characteristic evaluation instrument

Laser probe unit
                    
                    
                      MP Series
Applications for laser probe unit