High precision image processing offers optical characteristics evaluations
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MA Series
3D measuring instrument
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Microlens array form measuring and optical characteristic evaluation instrument
Features
High precision image processing offers optical characteristics evaluations
Functions : Effective focal length / Back focus / Transmittance / Focal position / Focal depth / MTF
Automatically measures microlens arrays(MLA)
The right figure shows the measurement optical system. The focused image(the pinhole slit image) of the paralle laser beam is enlarged by the microscope lens and is captured by the camera. The image processing evaluates this captured image on its optical characteristics.
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Measurement optical system
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Automatically measures microlens arrays (MLA)
Matrix measurement software
The specialized matrix measurement software offers automatic measurement of MLA by registering the array patterns
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Nomarski interference contrast observation
NH microscope can load Nomarski interference contrast optical system.Nomarski optical system. Nomarski optical system visualizes angstrom-level surface roughness and scratches that normal bright-field optical systems cannot visualize, and offers immediate quantitative measurements of roughness and step heights.
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NH-3Ns loaded with Nomarski optical system
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Ray diagram of NH Series with Nomarski optical system
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Functions
Laser Probe measurement
・Radius of curvature and center coordinates of each lens surface
・Circularity
・Height of apex, XY coordinates
・Cross-sectional and three-dimensional shape measurement, surface roughness measurement
・Circularity
・Height of apex, XY coordinates
・Cross-sectional and three-dimensional shape measurement, surface roughness measurement
Image Processing
・Effective focal length
・Back focus
・Transmittance
・Focal position
・Focal depth (option)
・MTF (option)
・Back focus
・Transmittance
・Focal position
・Focal depth (option)
・MTF (option)
Specifications
Measuring area( X, Y, Z, AF)
100, 100, 100, 10mm
X-Y Axis Linear Scale
0.1μm
AF Axis Linear Scale
0.01μm
Measuring method
Point Autofocus ISO 25178-605
Raser
λ=635nm <1mW
Examples of measurements that this equipment is good at
Examples that can be measured with this equipment
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Fresnel lens molding die
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Grating
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Volume of solder
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HDD head suspension
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High-density mounting board
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Surface of aspherical lens molding die
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Fingerprint
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Human hair
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Unevenness of evaporated metal film
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Diamond abrasive grain
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Tip of turning tool
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BGA
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Warpage and waviness of wafer
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Grinding work surface
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Wear volume of brake pad
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Tooth flank of a precision gear
More Information
We welcome your inquiry by telephone / fax / information request form.
- Phone
- +81 422-49-1491
- Fax
- +81 422-49-1117